Basics of Crystallography: Difference between revisions
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* [[Scattering]] | * [[iucr:Bragg's_law|Bragg's Law]] and [[Scattering]] | ||
* [[Anomalous scattering | * [[Resolution| Resolution of a Reflection]] | ||
* [[Friedel's law]] | * [http://www.bmsc.washington.edu/scatter Anomalous scattering] | ||
* [[ | * [[iucr:Friedel's law|Friedel's law]] | ||
* [[ | * [[Symmetry and space groups]] | ||
* [[ | * [[Centric and acentric reflections|Special positions]] | ||
* [[Centric and acentric reflections]] | |||
* [[Intensity statistics]] | |||
* [[Choice of origin]] | |||
* [[xds:Space_group_determination#Space_groups_as_combinations_of_symmetry_elements|Ways to index a diffraction pattern]] | |||
* [[non-crystallographic symmetry]] | * [[non-crystallographic symmetry]] | ||
* [[Wilson plot]] | |||
==See also== | |||
[[iucr:Structure_determination|Definitions and explanations in the IUCr Online Dictionary]] |
Latest revision as of 06:58, 29 July 2015
- Bragg's Law and Scattering
- Resolution of a Reflection
- Anomalous scattering
- Friedel's law
- Symmetry and space groups
- Special positions
- Centric and acentric reflections
- Intensity statistics
- Choice of origin
- Ways to index a diffraction pattern
- non-crystallographic symmetry
- Wilson plot