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where <math>\langle I_{hkl}\rangle</math> is the average of symmetry- (or Friedel-) related observations of a unique reflection. | where <math>\langle I_{hkl}\rangle</math> is the average of symmetry- (or Friedel-) related observations of a unique reflection. | ||

It can be shown that this formula results in higher R-factors when the redundancy is higher <ref name="DiKa97">K. Diederichs and P.A. Karplus (1997). Improved R-factors for diffraction data analysis in macromolecular crystallography. Nature Struct. Biol. 4, 269-275 [http://strucbio.biologie.uni-konstanz.de/strucbio/files/nsb-1997.pdf]</ref>. In other words, low-redundancy datasets appear better than high-redundancy ones, which obviously violates the intention of having an indicator of data quality! | It can be shown that this formula results in higher R-factors when the redundancy is higher (Diederichs and Karplus <ref name="DiKa97">K. Diederichs and P.A. Karplus (1997). Improved R-factors for diffraction data analysis in macromolecular crystallography. Nature Struct. Biol. 4, 269-275 [http://strucbio.biologie.uni-konstanz.de/strucbio/files/nsb-1997.pdf]</ref>). In other words, low-redundancy datasets appear better than high-redundancy ones, which obviously violates the intention of having an indicator of data quality! | ||

* Redundancy-independant version of the above: | * Redundancy-independant version of the above: | ||

<math> | <math> | ||

R_{meas} = \frac{\sum_{hkl} \sqrt \frac{n}{n-1} \sum_{j=1}^{n} \vert I_{hkl,j}-\langle I_{hkl}\rangle\vert}{\sum_{hkl} \sum_{j}I_{hkl,j}} | R_{meas} = \frac{\sum_{hkl} \sqrt \frac{n}{n-1} \sum_{j=1}^{n} \vert I_{hkl,j}-\langle I_{hkl}\rangle\vert}{\sum_{hkl} \sum_{j}I_{hkl,j}} | ||

</math> | </math> | ||

which unfortunately results in higher (but more realistic) numerical values than R<sub>sym</sub> / R<sub>merge</sub> <ref name="DiKa97"/> | which unfortunately results in higher (but more realistic) numerical values than R<sub>sym</sub> / R<sub>merge</sub> | ||

(Diederichs and Karplus <ref name="DiKa97"/> , | |||

Weiss and Hilgenfeld <ref name="WeHi97">M.S. Weiss and R. Hilgenfeld (1997) On the use of the merging R-factor as a quality indicator for X-ray data. J. Appl. Crystallogr. 30, 203-205[http://dx.doi.org/10.1107/S0021889897003907]</ref>). | |||

* measuring quality of averaged intensities/amplitudes: | * measuring quality of averaged intensities/amplitudes: | ||

for intensities use (M.S. Weiss. Global indicators of X-ray data quality. J. Appl. Cryst. (2001). 34, 130-135 [http://dx.doi.org/10.1107/S0021889800018227]) | for intensities use | ||

(Weiss <ref name="We01">M.S. Weiss. Global indicators of X-ray data quality. J. Appl. Cryst. (2001). 34, 130-135 [http://dx.doi.org/10.1107/S0021889800018227]</ref>) | |||

<math> | <math> | ||

R_{p.i.m.} = \frac{\sum_{hkl} \sqrt \frac{1}{n} \sum_{j=1}^{n} \vert I_{hkl,j}-\langle I_{hkl}\rangle\vert}{\sum_{hkl} \sum_{j}I_{hkl,j}} | R_{p.i.m.} = \frac{\sum_{hkl} \sqrt \frac{1}{n} \sum_{j=1}^{n} \vert I_{hkl,j}-\langle I_{hkl}\rangle\vert}{\sum_{hkl} \sum_{j}I_{hkl,j}} | ||

</math> | </math> | ||

< | R<sub>mrgd-I</sub> is similarly defined in Diederichs and Karplus <ref name="DiKa97"/>. | ||

Similarly, one should use R<sub>mrgd-F</sub> as a quality indicator for amplitudes <ref name="DiKa97"/>, which may be calculated as: | Similarly, one should use R<sub>mrgd-F</sub> as a quality indicator for amplitudes <ref name="DiKa97"/>, which may be calculated as: |

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