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Note: the pixel numbering in VIEW goes from 0 to NX-1 (similar for y), whereas XDS using a numbering of 1 to NX (NY). Thus, if you find out a position on the detector (e.g. the direct beam) by using VIEW, you should add 1 in both x and y if you want to put the numbers into [[XDS.INP]]. | Note: the pixel numbering in VIEW goes from 0 to NX-1 (similar for y), whereas XDS using a numbering of 1 to NX (NY). Thus, if you find out a position on the detector (e.g. the direct beam) by using VIEW, you should add 1 in both x and y if you want to put the numbers into [[XDS.INP]]. | ||
The Logo of this wiki (upper left) shows part of FRAME.pck as visualized with VIEW. Here we see the "pixel labelling method" of [[XDS]] at work: the thin lines around the reflections demarcate the limits of the integration | The Logo of this wiki (upper left) shows part of FRAME.pck as visualized with VIEW. Here we see the "pixel labelling method" of [[XDS]] at work: the thin lines around the reflections demarcate the limits of the integration area (which is used to calculate the intensity of the reflection). The size of the integration area is calculated from BEAM_DIVERGENCE, but in case two such integration areas overlap, then each pixel in the overlap region is assigned to the nearest reflection in reciprocal space. | ||
Empty integration areas belong to weak reflections. Reflections without integration area are partial reflections, whose center is on an adjacent frame. | Empty integration areas belong to weak reflections. Reflections without integration area are partial reflections, whose center is on an adjacent frame. |